TECHNICAL DOCUMENTS
GINPINTEC
Customer provide testing requirement
Testing service process
RF/DC probe head and RF Accessories
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MEMS type probe head with better performance up to 110Ghz in standard configuration : GS, SG, GSG, GSSG, GSGSG.
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Special configuration request could be design with cantilever type (Max freq ~ 67GHz)
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Pure DC or DC/RF wedge probe head were also provided.
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The Cal kit is standard pitch GSG 100um, 150um, 200um & 250um with OSLT calibration.
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We provide the high quality GORE/WAKA RF cables with Max. frequency 110GHz and WR-10 connector.
6’ inch auto wafer probe System
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All the test system are located in the class 5000 clean room.
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All DUT wafers are storage in the RH < 20% Dry cabinet.
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Auto probe station support 6 inch wafer level test (4 inch also compatible).
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RFOW compatible with well know RF equipment manufactures KEYSIGTH /ANRITSU /R&S .
Clean Room Environment
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Class 5000 clean room.
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All DUT wafers are storage in the RH < 20% Dry cabinet.
Output Format
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GINPINTEC provides the CSV raw data format.
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The die location provide 2 dimension XY coordinate.
